Seminars and Events

Study of interface chemistry at the atomic level by atom probe tomography

Date/Time: 05.11.2013. 09:00 a.m.
Place: Materials Day 2013, Ruhr-Universität Bochum, Bochum, Germany

George Smith, Department of Materials, University of Oxford, Oxford, United Kingdom

Atom probe tomography (APT) enables the study of interface chemistry with sub-nanometer spatial resolution, in an increasingly wide range of materials. The principles of the technique will be explained, and several examples will be given of the use of this method to obtain information of fundamental scientific importance and practical relevance to high technology engineering systems:
(i) Equilibrium segregation at grain boundaries, including direct measurement of Gibbs Excess.
(ii) Equilibrium segregation at interphase interfaces in metallic materials
(iii) Surface segregation, including chemically-driven segregation during oxidation reactions
(iv) Non-equilibrium segregation at grain boundaries during irradiation
(v) Interfacial mixing effects during the growth of metallic and semiconductor nanostructures
(vi) Interfacial chemistry of core-shell nanoparticles for catalyst applications.

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