Publications

Current tuned slotted Y-branch laser for wafer thickness measurements with THz radiation

Surkamp, N. and Gerling, A. and O'Gorman, J. and Honsberg, M. and Schmidtmann, S. and Nandi, U. and Preu, S. and Sacher, J. and Brenner, C. and Hofmann, M.R.

ELECTRONICS LETTERS
Volume: 57 Pages: 936-938
DOI: 10.1049/ell2.12314
Published: 2021

Abstract

« back