Publications

Spatial Identification of Dielectric Properties using Synthetic Aperture Radar

Barowski, J. and Jebramcik, J. and Wagner, J. and Pohl, N. and Rolfes, I.

IMWS-AMP 2019 - 2019 IEEE MTT-S INTERNATIONAL MICROWAVE WORKSHOP SERIES ON ADVANCED MATERIALS AND PROCESSES FOR RF AND THZ APPLICATIONS
Volume: Pages: 139-141
DOI: 10.1109/IMWS-AMP.2019.8880121
Published: 2019

Abstract
This contribution presents a methodology and a measurement setup for spatially resolved material characterization. For this purpose, calibrated millimeter-wave (mmWave) frequency modulated continuous wave (FMCW) radar systems, operating up to 250 GHz, are utilized. The calibration scheme allows for a systematic error correction comparable to a vector network analyzer (VNA). A synthetic aperture radar (SAR) measurement is used to generate a focused 3-dimensional image with very high resolution. A precise spatial distribution of the material parameters is obtained by a novel combination of the imaging and material parameter extraction algorithms. © 2019 IEEE.

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