Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range

Makarov, S. and Pikuz, S. and Ryazantsev, S. and Pikuz, T. and Buzmakov, A. and Rose, M. and Lazarev, S. and Senkbeil, T. and Von Gundlach, A. and Stuhr, S. and Rumancev, C. and Dzhigaev, D. and Skopintsev, P. and Zaluzhnyy, I. and Viefhaus, J. and Rosenhahn, A. and Kodama, R. and Vartanyants, I.A.

Volume: 27 Pages: 625-632
DOI: 10.1107/S1600577520002192
Published: 2020

The unique diagnostic possibilities of X-ray diffraction, small X-ray scattering and phase-contrast imaging techniques applied with high-intensity coherent X-ray synchrotron and X-ray free-electron laser radiation can only be fully realized if a sufficient dynamic range and/or spatial resolution of the detector is available. In this work, it is demonstrated that the use of lithium fluoride (LiF) as a photoluminescence (PL) imaging detector allows measuring of an X-ray diffraction image with a dynamic range of ∼107 within the sub-micrometre spatial resolution. At the PETRA III facility, the diffraction pattern created behind a circular aperture with a diameter of 5μm irradiated by a beam with a photon energy of 500eV was recorded on a LiF crystal. In the diffraction pattern, the accumulated dose was varied from 1.7 × 105Jcm-3 in the central maximum to 2 × 10-2Jcm-3 in the 16th maximum of diffraction fringes. The period of the last fringe was measured with 0.8μm width. The PL response of the LiF crystal being used as a detector on the irradiation dose of 500eV photons was evaluated. For the particular model of laser-scanning confocal microscope Carl Zeiss LSM700, used for the readout of the PL signal, the calibration dependencies on the intensity of photopumping (excitation) radiation (λ = 488nm) and the gain have been obtained. © 2020. J. Synchrotron Rad.

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