Publications

Quantitative STEM Imaging and Multislice Simulation of Stacking Fault Defects for Exciton Trapping in GaAs

Spurgeon, S. and Matthews, B. and Sushko, P. and Linpeng, X. and Viitaniemi, M. and Durnev, M. and Glazov, M. and Wieck, A. and Ludwig, Ar. and Fu, K.-M.

MICROSCOPY AND MICROANALYSIS
Volume: Pages:
DOI: 10.1017/S1431927620022904
Published: 2020

Abstract

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