Local Surface Modifications Investigated by Combining Scanning Electrochemical Microscopy and Surface-Enhanced Raman Scattering

Clausmeyer, J. and Nebel, M. and Grützke, S. and Kayran, Y.U. and Schuhmann, W.

Volume: 83 Pages: 414-417
DOI: 10.1002/cplu.201800031
Published: 2018

Scanning electrochemical microscopy (SECM) is coupled with surface-enhanced Raman scattering (SERS) microscopy to characterize local surface modifications. SECM is utilized for the surface patterning of para-nitrothiophenol self-assembled monolayers (SAMs) in the direct mode of SECM with a subsequent readout of the chemical patterns by means of combined SECM-SERS. The SECM-SERS combination allows monitoring of local electrochemical processes and provides simultaneous complementary spectroscopic information. The reaction products upon SAM reduction, specifically p-aminothiophenol groups, are distinguished from the pristine SAM and locally ruptured areas. © 2018 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim

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