High-Throughput Characterization of Structural and Photoelectrochemical Properties of a Bi-Mo-W-O Thin-Film Materials Library

Nowak, M. and Gutkowski, R. and Junqueira, J. and Schuhmann, W. and Ludwig, Al

Volume: 234 Pages: 835-845
DOI: 10.1515/zpch-2019-1439
Published: 2020

A Bi-W-Mo-O thin-film materials library was fabricated by combinatorial reactive magnetron sputtering. The composition spread was investigated using high-throughput methods to determine crystalline phases, composition, morphology, optical properties, and photoelectrochemical performance. The aurivillius phase (Bi2O2)2+ (BiM(W1-NMoN)M-1O3M+1)2- is the predominantly observed crystal structure, indicating that the thin films in the library are solid solutions. With increasing amounts of Mo ≙ 7-22% the diffraction peak at 2θ = 28° ≙ [131] shifts due to lattice distortion, the photoelectrochemical activity is increasing up to a wavelength of 460 nm with an incident photon to current efficiency (IPCE) of 4.5%, and the bandgap decreases. A maximum photocurrent density of 31 μA/cm2 was measured for Bi31W62Mo7Oz at a bias potential of 1.23 V vs. RHE (0.1 M Na2SO4). © 2020 Wolfgang Schuhmann, Alfred Ludwig et al., published by De Gruyter, Berlin/Boston 2020.

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