Publications

Digital holography for evaluation of the refractive index distribution externally induced in semiconductors

Besaga, V.R. and Gerhardt, N.C. and Hofmann, M.R.

PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Volume: 11306 Pages:
DOI: 10.1117/12.2544160
Published: 2020

Abstract
In this paper, we analyse the capabilities of the digital holographic approach for evaluation of the refractive index distribution appearing in semiconductor materials due to external optical excitation. The study is based on a modified transmission Mach-Zehnder holographic microscope operating in the near-infrared spectral range. Practical considerations for holographic characterization of semiconductor samples are discussed. Experimentally measured data are compared with simulations as well as approaches to interpretation of the retrieved data are covered. © COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.

« back