Publications

Contrast of 83% in reflection measurements on a single quantum dot

Lochner, P. and Kurzmann, A. and Schott, R. and Wieck, A.D. and Ludwig, Ar. and Lorke, A. and Geller, M.

SCIENTIFIC REPORTS
Volume: 9 Pages:
DOI: 10.1038/s41598-019-45259-z
Published: 2019

Abstract
We report on a high optical contrast between the photon emission from a single self-assembled quantum dot (QD) and the back-scattered excitation laser light. In an optimized semiconductor heterostructure with an epitaxially grown gate, an optically-matched layer structure and a distributed Bragg reflector, a record value of 83% is obtained; with tilted laser excitation even 885%. This enables measurements on a single dot without lock-in technique or suppression of the laser background by cross-polarization. These findings open up the possibility to perform simultaneously time-resolved and polarization-dependent resonant optical spectroscopy on a single quantum dot. © 2019, The Author(s).

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