Publications

Asymptotic Simulation Methods as Forward Models in Multilayer Material Characterization Applications

Vogt, S. and Garten, O. and Jebramcik, J. and Barowski, J. and Rolfes, I.

IMWS-AMP 2019 - 2019 IEEE MTT-S INTERNATIONAL MICROWAVE WORKSHOP SERIES ON ADVANCED MATERIALS AND PROCESSES FOR RF AND THZ APPLICATIONS
Volume: Pages: 109-111
DOI: 10.1109/IMWS-AMP.2019.8880112
Published: 2019

Abstract
In this paper a geometrical optics and a physical optics approach are presented as forward models for multilayer problems. The simulation results are validated by measurements and a full wave simulation. The used measurement system is based on a frequency modulated continuous wave radar operating from 68GHz to 92GHz. A matching pursuit decomposition is used to evaluate the relative permittivity and the thickness of the layers to compare the different simulations and the measurement. © 2019 IEEE.

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