An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography

Peng, Z. and Lu, Y. and Hatzoglou, C. and Kwiatkowski Da Silva, A. and Vurpillot, F. and Ponge, D. and Raabe, D. and Gault, B.

Volume: 25 Pages: 389-400
DOI: 10.1017/S1431927618016112
Published: 2019

We introduce an efficient, automated computational approach for analyzing interfaces within atom probe tomography datasets, enabling quantitative mapping of their thickness, composition, as well as the Gibbsian interfacial excess of each solute. Detailed evaluation of an experimental dataset indicates that compared with the composition map, the interfacial excess map is more robust and exhibits a relatively higher resolution to reveal compositional variations. By field evaporation simulations with a predefined emitter mimicking the experimental dataset, the impact of trajectory aberrations on the measurement of the thickness, composition, and interfacial excess of the decorated interface are systematically analyzed and discussed. Copyright © Microscopy Society of America 2019.

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